Wafer measurement system CM300xi-ULN

300 mm Probe Station for Flicker Noise (1/f), Random Telegraph Signal Noise (RTN or RTS), and Phase Noise Measurements of Ultrasensitive Devices FormFactor has enhanced it’s industry-leading CM300xi Probe Station with revolutionary technologies to meet new testing capabilities at the 5, 3, and 2 nm technology nodes, targeted for 5G and beyond applications. The new CM300xi-ULN now enables unprecedented measurement performance and achieves four significant industry firsts in the arena of on-wafer, low frequency flicker, RTN, and phase noise testing: PureLine 3 Technology First automated probe station to achieve -190dB spectral noise* Plug In and Go Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments Autonomous 24/7 Operation Up to 4x faster flicker noise thermal testing on 30 μm pads Reduce Setup Time and Costs Exclusive low noise site survey, and system verification services