3D measurement system PM300

for wafersfor semiconductorsmicroscope

The PM300 Analytical Probe Station is the industry benchmark in manual semiconductor failure analysis and in-process testing. The superior mechanics of this versatile probe system deliver a stable and precise system setup regardless of your application. The PM300 is available as open or shielded system PM300PS. The PM300PS manual analytical probe system creates a measurement environment free from electromagnetic (EMI) and radio-frequency interference (RFI) for device characterization and modeling, process development, wafer-level reliability, failure analysis and 3D IC engineering test.