Wafer measurement system MicroProf® FS

The FRT MicroProf® FS is a fully automated wafer metrology tool, configurable for a wide range of applications in the wafer foundry, using both standard and customized solutions. Flexibility and versatility are keywords when it comes to metrology solutions for today’s silicon foundry applications. MicroProf FS provides a modular approach to create a fully automated multi-sensor tool that can solve all required measurement tasks. That’s why we call it the Foundry Star! For its core metrology component, the proven FRT MicroProf 300 multi-sensor metrology tool is used to allow the measurement of different products and – by using a hybrid metrology concept – enhances the precision of measurements on samples where a single sensor or measuring principle is just not enough. The measurement system of the MicroProf FS is equipped with a granite base setup, with a three-point sample fixture or a vacuum chuck.