The BSPIO-RELE5 is a parallel-scan controller which has access to up to 20 electrical analog nodes. This helps ind riving the analog signals inputs or sensing analog signal outputs. This instrument has a traditional control logic or UUT boundary scan with adds to the JTAG fixtures the capability of analog tests and measurements. It has two basic versions and both of which are compatible with the standard DIN41612 female connectors in a test fixture. Out of the two basic versions the BSPIO-RELE5-A1 is primarily intended for test fixtures with few BSPIOs and contains a standard TTL interface on the TAPs TCK Signal. Using a direct connection to JTAG/IEEE 1149.1 Test Access Port (TAP) helps in facilitating boundary-scan interconnection testing. The other version BSPIO-RELE5-A2 contains a balanced LVDS interface on the TAPs TCK signal and is intended for test fixtures with many BSPIOs. This module facilitates boundary-scan interconnection testing using a small interface connection to the JTAG/IEEE 1149.1 TAP.