Test power adapter 39 ch | BSPIO-LVDS39

male

The BSPIO-LVDS39 gives bi-directional parallel-scan access to up to 39 electrical nodes with LVDS interfaces for the driving and sensing of rationale qualities. The BSPIO-Lvds39 is accessible in two essential renditions, both of them good with the standard DIN41612 female connectors in a test installation. One form, the BSPIO-Lvds39-A1, is principally proposed for test installations with few BSPIOsand holds a standard TTL interface on the TAP's TCK indicator. This module encourages limit filter interconnection testing utilizing immediate association with the JTAG/IEEE 1149.1 Test Access Port (TAP). The other form, the BSPIO-Lvds39-A2, is proposed for test apparatuses with numerous BSPIOs and holds an adjusted LVDS interface on the TAP's TCK sign. This module encourages limit check interconnection testing utilizing a little interface association with a JTAG/IEEE 1149.1 TAP.