Test power adapter 24 ch | BSPIO-DIO888

male

The BSPIO-DIO888 is capable of providing bi-directional parallel-scan access to up to 40 electrical I/O nodes. This is achieved with high voltage level and 16 nodes with standard TTL level for driving and sensing logic values. Increased effectiveness is possible through boundary-scan testing which enables verification of board edge and on-board connectors and within logic clusters. Available in two basic versions they are BSPIO-DIO888 compatible with the standard DIN41612 female connectors in a test fixture. One version is primarily intended for test fixtures and contains a standard TTL interface. The other version the BSPIO-DIO888-2 is intended for test fixtures with many BSPIOs and contains balanced LVDS interface on the TAPs TCK signal.