The combination of Electronic Dynamometer and Digital Multimeter permits to measure how the behavior of conductive and semiconductive products changes when subjected to deformation cycles.
It is possible to subject the specimens to deformation in traction, compression or bending.
The measurements can be made at room temperature or in a climatic chamber (between -40 °C and +250 °C).
The multimeter allows you to measure electrical resistance between 10 Micro-Ohms and 120 Mega-Ohms.
Instrument Setup Instrument configuration includes:
- Gibitre standard Tensile Tester
- High-Accuracy-Digital Multimeter
- Electrically insulated clamps to allow the measurement of the electrical resistance of the specimen during the applied deformation cycle.
The instrument can be equipped with a climatic chamber for carrying out tests at a controlled temperature.
The TensorCheck Software allows the complete and simultaneous control of the instrument, the multimeter and the Environmental Chamber and processes the Force, Displacement, Temperature and Resistivity signals.