Industrial camera C15333-10E

machine visiondigitaldetection

SWIR (short-wavelength infrared) imaging is a great solution for nondestructive inspection. It sees under the surface, differentiates materials based on their SWIR spectral signatures, and offers a safe and convenient way to ensure product quality. Integrating SWIR imaging into production lines requires cameras such as the C15333-10E InGaAs line scan camera, whose high SWIR sensitivity and fast line rate are ideal for real time, in-line non-destructive inspection. Features • SWIR sensitivity from 950 nm to 1700 nm • 1024 pixel linear array • Maximum line rate: 40 kHz • Interface: Employs Gigabit Ethernet • Equipped with high quality images (Back ground subtraction, Real time shading correction) Applications • Food and agricultural products (damage inspection, quality screening, material discrimination, etc.) • Semiconductors (Si wafer pattern inspection, solar cell inspection by EL/PL, etc.) • Industry (moisture content, leak detection, container inspection, etc.) Specifications Type number : C15333-10E Quantum efficency : above 60 % (1100 nm ～ 1600 nm) * Imaging device : InGaAs line sensor Effective no. of pixels : 1024 (H) × 1 (V) Cell size : 12.5 μm (H) × 12.5 μm (V) Effective area : 12.8 mm (H) × 0.0125 mm (V) Readout speed : Internal mode: 40 kHz (21 μs exposure time) Sync readout: 40 kHz Exposure time : 21 μs to 1 s (1 μs step) External trigger input : Sync readout External trigger signal routing : 12 pin SMA or HIROSE connector Image processing functions : Background subtraction, Real time shading correction Interface : Gigabit Ethernet A/D converter : 14 bit