Thickness measurement system C10323-02

opticalfor filmhigh-speed

The Optical NanoGauge Thickness measurement system C10323 is a microscopic thickness measurement systems. Objects with irregular surfaces that would produce high level of scattered light cannot be measured at the macro level. For these types of objects, measuring a small area reduces scattered light making measurement possible. The power supply voltage of C10323-02 is AC100 V to AC120 V. Features • Thickness measurement in micro field of view • High speed and high accuracy • Analyze optical constants (n, k) • External control available Specifications Type number : C10323-02 Measurable film thickness range (glass) : 20 nm to 50 μm① Measurement reproducibility (glass) : 0.02 nm② Measurement accuracy (glass) : ±0.4 %③ Light source : Halogen light source Measurement wavelength : 400 nm to 1100 nm Spot size : φ8 μm to φ80 μm④ Working distance : Refer to objective lens list Number of measurable layers : Max. 10 layers Analysis : FFT analysis, Fitting analysis, Optical constant analysis External control function : RS-232C, PIPE, Ethernet Interface : USB 2.0 Power supply : AC100 V to AC120 V , 50 Hz/60 Hz Power consumption : Approx. 250 VA