CCD image sensor S11850 series
infraredUVhigh-speed

CCD image sensor
CCD image sensor
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Characteristics

Technology
CCD
Spectrum
infrared, UV
Other characteristics
high-speed, cooled

Description

Improved etaloning characteristics, Constant element temperature control These are back-thinned CCD image sensors designed for spectrometers. Two types consisting of a low noise type (S11850-1006-01, S11850-1006-01) and high-speed type (S11851-1106-01) are available with improved etaloning characteristics. They offer nearly flat spectral response characteristics with high quantum efficiency from the UV to near infrared region. A thermoelectric cooler is placed inside the package to keep the element temperature constant (approx. 5 °C) during operation. Features -Improved etaloning characteristics -One-stage TE-cooled type  (element temperature: approx. 5 °C) -High sensitivity over a wide spectral range and nearly flat spectral response characteristics -High CCD node sensitivity: 6.5 μV/e- -High full well capacity, wide dynamic range  (with anti-blooming function) -Pixel size: 14 × 14 μm Specifications • Type : Binning type • Low etaloning type • Image size : 14.336 x 0.896 mm • Number of effective pixels : 1024 x 64 pixels • Pixel size : 14 x 14 μm • Spectral response range : 200 to 1100 nm • Line rate (typ.) : 189 lines/s • Line rate (max.) : 341 lines/s • Dark current (typ.) : 50 e-/pixel/s • Readout noise (typ.) : 6 e- rms • Cooling : One-stage TE-cooled • Window material : Quartz glass • Package : Ceramic • Measurement condition : Typ. Ta=25 ℃, Dark current: MPP mode, unless otherwise noted

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