X-ray fluorescence spectrometer FISCHERSCOPE® XDAL®

for the electronics industrymeasurementcompact

The best detectors for thin layers. Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range. X-ray fluorescence analysis for higher demands. Thin, thinner, XDAL®: Thanks to the microfocus tube and various semiconductor detectors, the FISCHERSCOPE® X-RAY XDAL® series is ideal for applications in the field of thin and very thin coatings < 0.05 μm as well as for material analysis in the ppm range. The instrument version with the 50 mm² silicon drift detector is furthermore suitable for RoHS measuring. The flexible and, thanks to various configuration options (table, aperture, filter and detector), universal XDAL® measures reliably, precisely and stands for 100 % safety. Commissioning. Extremely fast and simple One device, many possibilities. Coating thickness measurement, material analysis and trace analysis Testing of multiple measuring points. Even with large samples, measuring points are possible on the entire sample surface Also for large samples. Hood with C-slot Fully automatable. Let your instrument work for you with just one click Compact design. Very good compromise between performance and space requirements • Microfocus tube with tungsten anode • Measuring spot approx.: Ø 0.15 mm • Silicon PIN and silicon drift detector for very good detection accuracy and high resolution • 3-fold changeable filters • Type approved full protection device • Determination of metal content in electroplating baths with corresponding accessories • 4-fold changeable apertures • Up to 140 mm possible heights of samples • Various measuring table options