X-ray fluorescence spectrometer FISCHERSCOPE® XDL®
measurementfor quality controlinspection

X-ray fluorescence spectrometer
X-ray fluorescence spectrometer
X-ray fluorescence spectrometer
X-ray fluorescence spectrometer
X-ray fluorescence spectrometer
X-ray fluorescence spectrometer
X-ray fluorescence spectrometer
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Characteristics

Type
X-ray fluorescence
Domain
measurement, monitoring, for quality control, inspection
Other characteristics
automated, robust

Description

Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis. Adjustment of the measuring distance through patented DCM method Type approved full protection device PC-detector with largest measuring window on the market The instruments of the FISCHERSCOPE® X-RAY XDL® series are predestined for measurements in quality assurance, incoming inspection and production monitoring. They are closely related to the , with one significant difference: the measuring direction from top down! This means convenient analysis of uneven samples for you as well as the possibility of automated measuring. Also for large samples. Hood with C-slot Built to last. Robust design for measurement on mass-produced parts Testing of multiple measuring points. Even with large samples, measuring points are possible on the entire sample surface Commissioning. Extremely fast and simple Tailor-made. Different models offer the optimal solution for your application Quick-measure design. The sample is placed and ready for measurement in just a few steps

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