Simply detecting more: top-down inspection with pulsed X-ray technology based on the HEUFT SPECTRUM II.
The HEUFT eXaminer II XB achieves simply more when specifically detecting solid foreign objects in packaged and unpackaged food: the unique combination of pulsed X-ray technology and full-field image converters carries out a careful top-down inspection with a new dimension in precision, flexibility and range with maximum operational reliability. The continuous examination of particularly large-sized products with a minimum amount of radiation is accomplished simply safely. The high level of automation of the HEUFT SPECTRUM II device platform and the self-explanatory HEUFT NaVi user guidance make the error-free operation of the end of line system simply easy.