With electron impact/electron attachment ionization modes
The Hiden HPR-20 EPIC gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
Atmospheric gas reaction kinetics
High purity gas analysis
Glovebox monitoring
The Hiden HPR-20 EPIC gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
The Hiden QIC quartz-lined sampling interface operating at up to 200oC provides fast response times of less than 300 milliseconds for most common gases and vapours, including water vapour.
The system includes the Hiden EPIC triple filter mass spectrometer including a high gain pulse ion counting electron multiplier detector with positive and negative ion detection. Analysis is both by standard electron impact ionization and by appearance potential soft ionisation (APSI-MS).
The system includes a software selectable mode, electron attachment mass spectrometry (EA-MS), to analyse negative ions formed within the internal ioniser by electron attachment. The electron attachment mode provides vital information for investigating electro-negative species, identifying the parent molecules of stable radicals from plasma processes for example.
DMM-dynamic multi-mode scanning- uniquely applied for the electron attachment ionization technique for electronegative gas studies
Extended mass range options to 1000 amu