Secondary ion mass spectrometer AutoSIMS

for analysisautomaticcompact

Automatic Surface Analysis System Hiden Analytical has developed a fully self-contained automatic surface analysis system in the AutoSIMS, an innovative secondary ion mass spectrometer (SIMS) that can perform routine and repetitive analysis with unattended operation. With a fully-automated X-Y stage and expanded holder, the AutoSIMS by Hiden can run hundreds of processes a day during uninterrupted 24/7 operation. Contamination with Silicone Flexible Solar Cell Surgical Stent Electronic Materials Hiden Analytical specializes in SIMS instruments for nanoscale depth profiling and quantitative surface analysis of myriad different sample types, from comprehensive workstations to compact SIMS solutions. The AutoSIMS comprises the same long-life oxygen-source primary ion gun and MAXIM analyzer found throughout the Hiden SIMS product line, with the addition of a modular cassette sample holder and a software-driven X-Y sample stage. This provides the basis for high-reliability detection of relevant surface spectra and three-dimensional (3D) depth profiles without human intervention. The long service life of the ion gun ensures a consistent high-stability beam is generated throughout extended periods of operation, allowing the cassette holder and sample stage to deliver continuous sample doses for high throughput batch analysis. Even novice operators can program the automatic surface analysis system by tweaking the matrix of experimental parameters through a simple spreadsheet.