A mass and energy analyser for plasma diagnostics
Hiden plasma probes measure some of the key plasma parameters and provide detailed information relating to plasma reaction chemistry.
Plasma Characterisation
Plasma Etching and ALE
HiPIMS
Diamond-Like Carbon (DLC) Coating
Pulsed Laser Deposition (PLD) Coatings
DC Magnetron Deposition of SiBCN Films
A wide range of industrial processes use electrical plasmas, and new applications are developing rapidly. In the microelectronics industry the demands of higher yields and shrinking device geometries mean that process reproducibility and understanding is vital.
Detailed understanding of the reaction kinetics of plasma ions and neutral species plays a key role in the development of advanced surface engineering processes such as HIPIMS.
Differentially pumped manifold with mounting flange to process chamber
High sensitivity / stability triple filter quadrupole, mass range options to 510amu
Pulse ion counting detector with 7 decade dynamic range
Energy analysis option by pole bias scanning 100eV
Ion extraction / exclusion optics with tuneable integral ioniser for Appearance Potential MS
Penning gauge and interlocks to provide over pressure protection
Signal gating and programmable signal gating option for time resolved studies in pulsed plasma
Analysis of neutrals and radicals as standard, +ve / -ve ion analysis option
Mu-Metal, Radio-metal shielding options, high pressure operation options
MASsoft control via RS232, RS485 or Ethernet LAN