Mass spectrometer ion source

A range of ion source options for residual gas analysis Hiden produces a wide variety of ion source types which can be fitted to our full range of RGAs. Ion source types are crucial to the performance of a RGA and having the ability to specify which source you require ensures our RGAs are custom configured for specific applications. Thermal analysis TA/MS Catalysis studies Reaction kinetics Fuel cells CVD/MOCVD/ALCVD Environmental monitoring Standard RGA A radially symmetric configuration for general applications UHV Low Profile Optimised for UHV TPD Studies enabling closer proximity of the ion source to the evolution surface Closed Source For high pressure studies with direct gas input used in conjunction with a differential pumping stage for the analyser XBS Cross Beam Configured specifically for MBE deposition rate monitoring and control Basic Cross Beam Used for analysis of molecular beams, where the beam may be liable to condense on ioniser surfaces. The source features an unobstructed pathway through the ionising region of the source. External shrouds are available to protect the quadrupole mass filter from condesing species Laser Cross Beam Source Includes two orthagonal unobstructed pathways for laser proton ionisation within the source cage region, providing an alternative to electron impact and electron attachment ionisation 4 Lens Ion Optics with Integrated Ioniser Additionally enables analysis of low energy positive and negative ions generated externally to the analyser. For electron, photon and laser stimulated desorption studies