Secondary ion mass spectrometer FIB-SIMS

for analysishigh-sensitivity

Add high performance SIMS capability to your existing FIB system Hiden Analytical offers high-performance bolt-on secondary ion mass spectrometry (SIMS) for existing focused ion beam (FIB) systems, providing outstanding surface specificity and a naturally high dynamic range for advanced nanoscale material analysis. Our FIB-SIMS systems are poised to enhance your operations, from routine detection tasks to complex sample preparation. Nanoscale materials analysis refers to a growing domain of instruments focused on the detection of trace and ultra-trace elements down to the parts per million (ppm) range. This is critical in high sensitivity three-dimensional (3D) elemental mapping and depth profiling; both key methods of materials analysis for analytical and preparative materials identification applications. Focused ion beam secondary ion mass spectrometry (FIB-SIMS) is among the most powerful materials identification techniques in high sensitivity nanoscale materials analysis. It combines the exceptional surface sensitivity of SIMS with a focused primary ion beam, laying the groundwork for qualitative compositional analysis of the uppermost nanolayers of materials of interest. FIB-SIMS can provide critical elemental data based on isotope and ion (atomic and molecular) detection, with a broad range of suitable application areas. Nano-scale Elemental Surface Mapping 3D Depth Profiling Materials Analysis Excellent sensitivity and dynamic range Customised software interface ‘Feature MS’ mode allows mass spectral data to be gained from a specific area of interest, such as a contaminant, grain boundary etc Customised mounting solutions available for any FIB system