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Quadrupole spectrometer MAXIM
secondary ion massfor analysis

quadrupole spectrometer
quadrupole spectrometer
quadrupole spectrometer
quadrupole spectrometer
quadrupole spectrometer
quadrupole spectrometer
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Characteristics

Type
quadrupole, secondary ion mass
Domain
for analysis

Description

A system for static and dynamic SIMS and SNMS applications The Hiden MAXIM quadruple SIMS analyser is a state of the art secondary ion mass spectrometer for positive and negative, static, dynamic and neutral analytical applications. The MAXIM analyser system includes an integral energy filter for ion acceptance at 30° to the probe axis, high transmission SIMS extraction optics, triple mass filter, pulse ion counting detector and control electronics. The 30° acceptance angle allows the MAXIM to be mounted with its axis parallel to the plane of the sample, leaving a clear view of the sampled area for other light or ion optics. The MAXIM is tolerant of sample charging making it an ideal probe for the analysis of insulators. Also, large acceptance angle allows for wide area imaging. Mass range options: 300amu, 500amu or 1000amu Detector: Ion counting detector, Positive and Negative ion detection, 107 cps Mass filter: Triple filter Pole diameter: 9mm Bakeout: 250°C Ion energy filter: 30° angular acceptance Ioniser: Electron bombardment, single filament for SNMS and RGA
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