Anisotropy factor measurement system 2-MGEM

opticallaboratorymicroscope

Developed in cooperation with Oak Ridge National Laboratory, a new instrument is advancing the understanding of 4th Generation nuclear fuels and reflected polarization characteristics. The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element. Contact us for more information about the 2-MGEM system and to see how Hinds Instruments works with our customers to solve complex metrology problems. Measuring TRISO: Understanding the preferential orientation of the graphite in TRISO inner pyrocarbon (IPyC) and outer pyrocarbon (OPyC) coating layers can identify formation orientation issues that will lead to premature failure of the containment.