Multi-parameter testing machine

semiconductor

X-Y type: Product features These high-speed, high-precision, high-reliability populated board flying probe testers are ideal for high-mix low volume production. Four-Wire measurement function enables detection of lifted leads of ICs as well as catching the dry joints. The capabilities extend to the active in-circuit test of FETs, relays, and 3-terminal voltage regulators--applications so far regarded as challenging test issues for conventional equipment. Optional features even allows to conduct simple functional measurement, boundary scan, and crystal oscillator frequency counting, etc. An X-Y ICT platform designed while keeping flexibility and future expandability in mind!