Coating thickness analyser FT110A
metalfor quality controlfor testing

Coating thickness analyser - FT110A - Hitachi High-Tech Analytical Science - metal / for quality control / for testing
Coating thickness analyser - FT110A - Hitachi High-Tech Analytical Science - metal / for quality control / for testing
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Characteristics

Measured entity
metal
Application domain
for quality control, for testing
Measured value
coating thickness
Configuration
benchtop
Technology
X-ray fluorescence

Description

High throughput coatings analysis The FT110A is a benchtop XRF analyzer designed to meet the challenges of in-production coatings analysis. Powerful X-ray fluorescence technology coupled with automated positioning functionality helps to increase productivity of plating shops while ensuring components meet the highest standards. Accuracy and reliability are central to XRF analysis that supports quality control, and the FT110A delivers the accuracy that today’s plated components need. An updated imaging system, automated sample positioning and a large sample stage make this analyzer very easy to use, increasing throughput and reducing human error. With the capability of measuring up to four layers at once, plus the substrate, the powerful FT110A will support your facility round the clock in meeting the highest industry plating specifications. Designed for high-throughput production, here’s how the FT110A can support your quality control. Powerful, high-sensitivity technology delivers results in seconds Non-destructive testing safe for finished goods Automated features increase productivity Analyze up to four layers and the substrate, plus bath solution Easy to use by non-specialist operators Measurement methods meets ISO 3497, ASTM B568 and DIN 50987 Large chamber accommodates a wide range of samples Customizable options to suit your application

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