Coating thickness analyzer FT160 Series

alloybenchtopX-ray fluorescence

Fast, accurate analysis of nanoscale coatings The FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection. The FT160’s polycapillary optics can measure nm-scale coatings on features smaller than 50 µm, and advanced detector technology gives you high accuracy while maintaining a short measurement time. Other features, such as a large sample table, wide opening door, high-definition sample camera and a substantial observation window, make it easy to load items of varying size and find the region of interest on a large substrate. Easy to use, this analyzer integrates seamlessly with your QA / QC process, alerting you to issues before they become a crisis. Designed for microspot and ultra-thin coatings analysis, the FT160’s optics and detector technology are optimized for the smallest of features. Large observation window for viewing analysis from a safe distance Measurement methods meet standards ISO 3497, ASTM B568 and DIN 50987 Test finishes for IPC-4552B, IPC-4553A, IPC-4554 and IPC-4556 conformity Automated feature location for fast sample setup Choice of analyzer configuration optimized for your application Measure nm-scale coatings on features smaller than 50 µm Double the analysis throughput of conventional instruments Accommodates large samples in a wide range of shapes Robust design tested for long-term production use