Hitachi High-Tech Europe GmbH: Metrology - Laboratory - DirectIndustry

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Hitachi High-Tech Europe GmbH

All Hitachi High-Tech Europe GmbH products

Electron Microscopes (SEM/TEM/STEM)

scanning transmission electron microscope

scanning transmission electron microscope SU9000II

for analysis for research BF-STEM

field emission scanning electron microscope

field emission scanning electron microscope SU8700

for analysis floor-standing Schottky field emission

field emission scanning electron microscope

field emission scanning electron microscope SU8600

for analysis 3D cold field emission

field emission scanning electron microscope

field emission scanning electron microscope SU7000

for analysis BF-STEM DF-STEM

field emission scanning electron microscope

field emission scanning electron microscope SU5000

for analysis 3D in-situ

scanning electron microscope

scanning electron microscope SU series

surface roughness for analysis for research

scanning electron microscope

scanning electron microscope FlexSEM 1000 II

for analysis for materials inspection for non-metallic inclusion inspection

SEM microscope TM4000 series

for analysis measuring atomic number contrast

EDX spectrometer

EDX spectrometer Quantax75

for analysis industrial R&D

X-ray spectrometer

X-ray spectrometer Element series

EDX for elemental analysis benchtop

EDX spectrometer

EDX spectrometer AZtec series

for analysis for metal analysis for mining

measurement software

measurement software HitachiMap 3D

visualization industrial laboratory

STEM microscope

STEM microscope HF5000

for materials research for materials analysis metrology

transmission electron microscope

transmission electron microscope HT7800 series

for research biomedical bright field

electron microscope

electron microscope NP6800

for analysis measuring high-resolution

electron microscope

electron microscope NE4000

for analysis cold field emission CCD

particle analysis software

particle analysis software AMICS

for the mining industry for microscopes for chemical processes

FE-SEM microscope

FE-SEM microscope SU3800SE/SU3900SE

multipurpose steel inspection for materials inspection

Focused Ion Beam Systems (FIB/FIB-SEM)

focused ion beam system

focused ion beam system NX5000

focused ion beam system

focused ion beam system NX9000

focused ion beam system

focused ion beam system NX2000

focused ion beam system

focused ion beam system MI4050

automatic sample preparation system

automatic sample preparation system

for electron microscopy vacuum benchtop

Sample Preparation

automatic sample preparation system

automatic sample preparation system MC1000

for SEM ion sputter vacuum

automatic sample preparation system

automatic sample preparation system ZONESEMⅡ

for the laboratory for SEM cleaning

automatic sample preparation system

automatic sample preparation system IM4000II

for SEM ion beam milling cooling

automatic sample preparation system

automatic sample preparation system ArBlade 5000

for SEM ion beam milling cooling

automatic sample preparation system

automatic sample preparation system ZoneTEM II

for SEM cleaning benchtop

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