Scanning electron microscope SU series

surface roughnessfor analysisfor research

Performance & Power in a Flexible Platform Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples. 1.Substantially Larger Specimen Chamber Accommodates Oversized and Heavy Samples ■Robust Stage for Flexibility in Sample Size, Shape, and Weight • The specimen exchange sequence prevents potential damage to the system or the sample. • Exchange the specimens without venting the specimen chamber, improving throughput. • Increase sample manipulation with Stage Free Mode*. • The Chamber Scope enhances the safety of stage movements*. ■Increased Viewing Area—SEM MAP Expands the Boundaries of Sample Navigation • Integrated in-chamber camera display • Easily navigate the entire observable area • Detector-oriented rotation 2.Evolution of the Market—Improved Automatic Functions for Operators of Any Skill Level ■Multiple Modes of Operation ■ Automatic Functions for Operators of Any Skill Level Improved auto algorithms—3X faster (compared with the Hitachi Model S-3700N) Improved auto focus function Features of our proprietary Intelligent Filament Technology (IFT): ■Multi Zigzag enables wide-area observation across multiple areas. ■Report Creator generates reports of acquired data. 3.Integrated Solutions for Various Applications ■A Variety of Accessories Mountable onto Any of the 20 Ports in the Innovative SU3900 Specimen Chamber. ■SEM/EDS Integration System*