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X-ray spectrometer Element seriesEDXfor elemental analysisbenchtop
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Characteristics
- Type
- X-ray, EDX
- Domain
- for elemental analysis
- Configuration
- benchtop
- Detector type
- SDD
Description
Element series are EDX systems produced by EDAX Instruments. Si3N4 window SDD enhances the mapping speed and detection limits.
Si3N4 Window
Si3N4 Window to optimize low energy X-ray transmission for light element analysis. Conventional detector window, there is improved mapping speed and detection limit.
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Electron Microscopes (SEM/TEM/STEM)
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