- Metrology - Laboratory
- Analytical Instrumentation
- EDX spectrometer
- Hitachi High-Tech Europe GmbH
- Products
- Catalogs
- News & Trends
- Exhibitions
X-ray spectrometer Element seriesEDXfor elemental analysisbenchtop
Add to favorites
Compare this product
Characteristics
- Type
- X-ray, EDX
- Domain
- for elemental analysis
- Configuration
- benchtop
- Detector type
- SDD
Description
Element series are EDX systems produced by EDAX Instruments. Si3N4 window SDD enhances the mapping speed and detection limits.
Si3N4 Window
Si3N4 Window to optimize low energy X-ray transmission for light element analysis. Conventional detector window, there is improved mapping speed and detection limit.
Catalogs
No catalogs are available for this product.
See all of Hitachi High-Tech Europe GmbH‘s catalogsOther Hitachi High-Tech Europe GmbH products
Electron Microscopes (SEM/TEM/STEM)
Related Searches
- Spectrometer
- Compact spectrometer
- Benchtop spectrometer
- Analysis spectrometer
- Chemical spectrometer
- Pharmaceutical spectrometer
- Spectrometer for industrial applications
- Real-time spectrometer
- R&D spectrometer
- X-ray spectrometer
- Metal analysis spectrometer
- High-precision spectrometer
- Quality control spectrometer
- Spectrometer for scientific applications
- High-speed spectrometer
- Electronics spectrometer
- Spectrometer for medical applications
- Spectrometer for the metallurgical industry
- Electronic spectrometer
- Research and development spectrometer
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.