FE-SEM microscope SU3800SE/SU3900SE
multipurposesteel inspectionfor materials inspection

FE-SEM microscope - SU3800SE/SU3900SE - Hitachi High-Tech Europe GmbH - multipurpose / steel inspection / for materials inspection
FE-SEM microscope - SU3800SE/SU3900SE - Hitachi High-Tech Europe GmbH - multipurpose / steel inspection / for materials inspection
FE-SEM microscope - SU3800SE/SU3900SE - Hitachi High-Tech Europe GmbH - multipurpose / steel inspection / for materials inspection - image - 2
FE-SEM microscope - SU3800SE/SU3900SE - Hitachi High-Tech Europe GmbH - multipurpose / steel inspection / for materials inspection - image - 3
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Characteristics

Type
FE-SEM
Technical applications
for materials inspection, steel inspection, industrial, multipurpose
Configuration
floor-standing
Electron source
Schottky field emission
Other characteristics
high-resolution, observation
Magnification

Min.: 5 unit

Max.: 600,000 unit

Resolution

0.9 nm, 2.5 nm

Description

The Hitachi SU3800SE and SU3900SE SEMs provide versatile imaging and analytical solutions for various applications. These instruments offer high-resolution imaging, intuitive navigation, and advanced automation, delivering reliable, consistent results in research and industrial environments. Their flexibility supports efficient workflows for both standard and large industrial samples, enhancing productivity and reproducibility. Key Features: Flexible Sample Handling SU3900SE: Handles large specimens up to 300 mm in diameter, 130 mm in height, and 5 kg. Its heavy-duty, eucentric 5-axis stage allows imaging of industrial materials like automotive parts without resizing, saving time and effort. Accommodates multiple samples for automated inspections. SU3800SE: Supports smaller specimens up to 200 mm in diameter, 80 mm in height, and 2 kg in weight, suited for broad applications. Effortless Navigation and Precision Control Motorised 5-axis stage (X, Y, Z, tilt, rotation) with auto-collision model for safe, precise navigation. An advanced optical camera system supports accurate positioning across large samples. High-Resolution, Auto-Aligned Imaging Schottky field emission optics offer high imaging performance without magnetic or electrical interference. Variable pressure mode allows observation of non-conductive samples without extra preparation. Auto-alignment speeds setup, enabling quality results for operators of all levels. Automated Workflows for Efficiency The EM Flow Creator automates repetitive tasks, reducing workload. Customisable observation recipes ensure consistent, high-quality results with minimal input, ideal for labs focused on efficiency.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.