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Raman spectrometer Raman AFM and nano-Raman TERSmicro-spectroscopy
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Characteristics
- Type
- Raman
- Domain
- micro-spectroscopy
Description
HORIBAs Raman technology is easily coupled to scanning probe microscopes (SPM). The Platform allows Atomic Force Microscopy (AFM), near-field optical techniques (SNOM, NSOM), Scanning Tunneling Microscopy (STM) and confocal optical spectroscopy (Raman and Fluorescence Imaging) in one versatile instrument, ready for Tip-Enhanced Raman Spectroscopy (TERS) or co-localized measurements.
The exceptional long-term stability and speed of our integrated Raman-AFM Platform bring reliable results both for co-localized measurements and TERS Imaging. A unique Platform for simultaneous measurements ensures the images you get are truly correlated.
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.