The GD-Profiler 2™ is the ideal analytical tool for coated material studies, process elaboration and control as it offers ultra-fast elemental depth profile analysis of thin and thick layers, conductive or isolating, with high sensitivity to all elements.
The system combines a glow discharge source powered by pulsed radio frequency with the ability to sputter layer by layer a representative area of the material investigated together with a high resolution and high sensitivity emission spectrometer that will measure in real-time all elements of interest.
It provides fast, simultaneous analysis of elements including the gases nitrogen, oxygen, hydrogen and chlorine.