Inspection device Helios 600
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Description
Our Photonic Visual Inspection Tool (PVIT) is designed to be compatible with the same base platform as our Photonic Test Prober, providing you with multiple testing options when required. Also, as with our PTP, our Photonic Visual Inspection Tool is designed for high throughput.
ast wafer level inspection using neural network supported algorithms
High resolution and low resolution mode
Waveguide inspection, particle detection, residue detection
Compatible with 100 , 150 & 200mm wafers
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