Spectroscopic ellipsometer alpha-SE

For routine measurements of thin film thickness and refractive index, this ellipsometer allows you to mount a sample, choose the model that matches your film, and press “measure”. You have results within seconds. Easy-to-Use Push-button operation is complemented by advanced software that takes care of the work for you. Powerful Proven spectroscopic ellipsometer technology gives you both thickness and index with much higher certainty than other techniques. Flexible Works with your materials – dielectrics, semiconductors, organics, and more. Affordable Spectroscopic ellipsometry for simple sample systems. Fast Hundreds of wavelengths simultaneously collected in seconds for immediate results.