UV-Vis-NIR spectrophotometer V-780 UV-Vis/NIR
double-beamspheretransmission

UV-Vis-NIR spectrophotometer - V-780 UV-Vis/NIR - JASCO Europe - double-beam / sphere / transmission
UV-Vis-NIR spectrophotometer - V-780 UV-Vis/NIR - JASCO Europe - double-beam / sphere / transmission
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Characteristics

Spectrum
UV-Vis-NIR
Optical design
double-beam
Measurement method
sphere, transmission, reflectance
Other characteristics
benchtop
Technical applications
for solids
Wavelength

Min.: 190 nm

Max.: 1,600 nm

Description

Exceptional sensitivity and resolution in NIR with high efficiency InGaAs detector in the range 190 to 1600 nm. Light source luminance control using digital feedback enables NIR spectra measurement with high sensitivity and high accuracy even with wide variation in absorbance. Comprehensive display and analysis of performance indicators, accessory information, measurement parameters and measurement data. Parameters for data processing can be selected from the followings: Peak detection, Peak height/area (ratio), basic quantitation (user formula) and film thickness calculation. Quantitative Measurement and Fixed-Wavelength Measurement: arithmetic formulas can be input into the parameter settings. Quantitative Measurement, Spectra Measurement, and Fixed-Wavelength Measurement: the sample name and comments can be saved together in the measurement order as a sequence.

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.