Burn-in test socket DCL-QFP1414-100-P050

QFN

Latch Lock type for or QFP,SOP Standard products The test socket that enables high-speed transmission signal measurement by adopting the contact method that directly presses the device lead against the board. The "Latch Lock type" that fixes the lid of the socket with a latch allows you to replace the device efficiently because the lid can be attached and detached simply by pressing it from above. We have a lineup of standard products that match the dimensions of QFP/SOP devices, and can be delivered in a short period of time. [Application] - Mounting on PCB for mass-production - Final test and inspection at real environment 　(ex. automobile, robotics, electrical devices for mobility) - IC failure analysis Since the general IC socket has terminals (spring probe, plate vane, etc.) between the board and the device, the number of contacts are increases, and signal would occurs deterioration or attenuation, but this socket is in a state close to soldering. It's the ideal for evaluating high-speed IC devices because it suppresses the deterioration of the signal. In addition to the Latch Lock type introduced on this page, we have the following line-up. - Latch Lock & Screw Lock type - Rotary Lever type - Screw type 　It can be seen that the characteristics are improved when using a conventional socket and when using a direct contact socket. ・Since the lid can be attached and detached simply by pressing it from above, the device can be replaced efficiently. ・Torque management is unnecessary from device setting to measurement preparation. ・We have a lineup of standard products that match the dimensions of QFN/SOP devices. ・Short delivery is possible.