Latch-lock test socket

direct-contactQFPSOP

The test socket that enables high-speed transmission signal measurement by adopting the contact method that directly presses the device lead against the board. The "Latch Lock type" that fixes the lid of the socket with a latch allows you to replace the device efficiently because the lid can be attached and detached simply by pressing it from above. We have a lineup of standard products that match the dimensions of QFP/SOP devices, and can be delivered in a short period of time. [Application] - Mounting on PCB for mass-production - Final test and inspection at real environment 　(ex. automobile, robotics, electrical devices for mobility) - IC failure analysis