High-frequency test socket GU10 Series

burn-inmanualFor Crystal Devices

Test & Burn-In Socket For Quartz Oscillators, MEMS, etc. Clam-shell, High Frequency type Frame size 10x16mm / 0.39x0.63" Designed for manual device setting. Suitable for characteristic evaluation tests. Uses ultra-short probe pins with a floating structure, suitable for use with high frequencies. - Temperature -40 to +150°C(typ.) - High reliability - Cost competitive - Customizable to suit your device Target device types: Quartz Crystal Unit, Quartz Oscillators, MEMS Devices, SAW Filters, Tuning Fork Resonators, etc.