AnalysisStation JED-2300T is an integration system of TEM/EDS based on a concept of “Image and Analysis”. Data management is carried out by automatically collecting the parameters such as magnification and accelerating voltage along with analysis data.
Features
Three types of Silicon Drift Detector (SDD) EDS are available, with the detection area being 30mm2, 60mm2 and 100mm2 respectively. The larger the detection area is, the greater the detection sensitivity becomes. By incorporating Dry SD100GV Detector (detection area 100mm2) to JEM-ARM200F (HRP), a large light receiving area and the high resolution are simultaneously realized, and a clear distinction of light elements such as “B,C,N,O” is possible.
High Speed Elemental Mapping
Dry SD100GV Detector featuring high sensitivity detects an Au catalyst particle in only one minute of measuring time.
• Specimen: Au Catalyst Particle supported on Ti Oxide
• Instrument: JEM-ARM200F + Dry SD100GV Detector
• Measurement Time Approx: 1 minute
• Probe Current: 1nA
• Pixel Number: 256 x 256 pixels
• Atomic Resolution Mapping
• Atomic columns of Sr and Ti are clearly segregated.
Atomic Resolution Mapping
Atomic columns of Sr and Ti are clearly segregated.
• Specimen: SrTiO3
• Instrument: JEM-ARM200F + Dry SD100GV Detector
• Measurement Time Approx.: 10 minutes
• Probe Current: 1nA
• Pixel Number: 128 x 128 pixels