FIB/SEM microscope CRYO-FIB-SEM

industrialfluorescence

This CRYO-FIB-SEM system incorporates a liquid nitrogen cooling stage and a cryocooled specimen transfer mechanism for frozen specimens, making it possible to prepare TEM specimens such as biopolymers. The specimen transfer mechanism has a built-in sputter coating function. Therefore, this CRYO-FIB-SEM system alone can perform a series of processes to create TEM specimens from frozen specimens including conductivity coating, protective film forming, and FIB processing. In addition, by using JEOL's CRYO ARM™ cartridge, direct specimen transfer to the CRYO ARM™ after TEM specimen preparation becomes easier. Features • Cryo Specimen Transfer Using CRYO ARM™ Cartridge After attaching a specimen mesh to the cartridge, it is no longer necessary to handle the specimen mesh using tweezers, so high-throughput specimen transfer can be performed. • Highly Stable Cooling Stage The thermal conductivity cooling stage reduces stage drift and vibration caused by the cooling process and realizes steady TEM specimen preparation. • JEOL's Unique Anti-Contamination Device With this newly developed anti-contamination device, ice contamination in the specimen chamber is reduced. Even during prolonged preparation of large specimen amounts, the device suppresses ice contamination to the fullest extent. Cryo CLEM Workflow A cryo-CLEM workflow using the CRYO ARM™ cartridge can be constructed using a cryostage manufactured by Linkam Scientific Instruments* and a fluorescence microscope manufactured by Nikon Solutions*. The stage coordinates of each instrument can be linked, so the orientation and position of the specimen can always be identified during specimen transfer between instruments.