Scanning electron microscope JSM-IT210

for analysiscompactautomatic

Easy to acquire data for all specimen types The JSM-210 is the most compact stationary scanning electron microscope of JEOL. The newly developed stage is motor-driven for all five axes of movement, making it safer and faster to use. In addition, the newly equipped "Simple SEM" automatically acquires observation and analysis by simply selecting the field of view. The JSM-IT210 is a new generation SEM that is compact and can be operated unattended. Features Guide from specimen exchange to automatic observation "Specimen Exchange Navi" 1. Follow the Navi to set specimen 2. Prepare for observation during evacuation 3. Start observation automatically • Magnify the optical image, transition to SEM image "Zeromag" The Zeromag function simplifies navigation providing a seamless transition from optical* to SEM image. The SEM, optical image and holder graphic are all linked for a global view of analysis locations. • Embedded EDS for Real-Time elemental composition during observation* "Live Analysis" Live Analysis is a function which displays the EDS spectrum or element maps in Real-Time during image observation. This function can support searching and provide an alert for target elements. • Automation for enhanced productivity "Simple SEM" Simple SEM automates image collection at multiple locations, conditions and magnifications. • Tools for speed Stage with high position accuracy. Relocate analysis positions with accuracy.