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EDX microscope PSEfor materials inspectioncorrelative
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Characteristics
- Type
- EDX
- Technical applications
- for materials inspection
- Other characteristics
- correlative
Description
Correlative Mikroscopy: Combination of Optical and SEM Data
SEM with EDX: JOMESA PSE
•Reads particle informations from database
•Fast SEM-EDX analysis of selected particles
•Optional: Full scan or all optical particle scan
•Stores results to database
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.