- Metrology - Laboratory
- Laboratory Equipment
- X-ray microscope
- JOMESA Meßsysteme
- Products
- Catalogs
- News & Trends
- Exhibitions
EDX microscope PSEfor materials inspectioncorrelative
Add to favorites
Compare this product
Characteristics
- Type
- EDX
- Technical applications
- for materials inspection
- Other characteristics
- correlative
Description
Correlative Mikroscopy: Combination of Optical and SEM Data
SEM with EDX: JOMESA PSE
•Reads particle informations from database
•Fast SEM-EDX analysis of selected particles
•Optional: Full scan or all optical particle scan
•Stores results to database
Related Searches
- Liquid separator filter
- Microscope
- Inspection microscope
- Self-backwashing filter
- Easy cleaning pre-filter
- Stereo microscope
- Optical stereo microscope
- Capsule filter
- Membrane filter
- Zoom stereo microscope
- Laboratory stereo microscope
- Inspection stereo microscope
- Industrial stereo microscope
- Nylon filter
- Materials inspection microscope
- Analysis stereo microscope
- Medical stereo microscope
- Polyamide filter
- Cellulose fiber filter
- X-ray microscope
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.