Characterization instrument 2600-PCT series

Developing and using MOSFETS, IGBTs, diodes and other high-power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. While I-V curve tracer software supports testing two-terminal devices on graphical SMUs, Keithley also offers high-power Parametric Curve Tracer configurations to support the full spectrum of device types and test parameters. These configurations more closely mimic the old Tektronix I-V curve tracers. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly. These configurations are also modular, so they can be upgraded in the future and the individual instruments like source measure units can be used for other applications. •Complete solutions engineered for optimum price and performance •Field upgradable and reconfigurable -- convert your PCT to a reliability or wafer sort tester •Configurable power levels: oFrom 200V to 3kV oFrom 1A to 100A •Wide dynamic range: oFrom µV to 3kV oFrom fA to 100A •Full range of capacitance-voltage (C-V) capability: ofF to µF oSupports 2-, 3-, and 4-terminal devices oUp to 3kV DC bias •High performance test fixture supports a range of package types •Probe station interface supports most probe types including HV triax, SHV coax, standard triax, and others