Keithley instrumentation makes it easy to build a LIV (light-current-voltage) system to test laser diode modules cost-effectively.
•2520 Pulse Laser Diode Test System: Synchronizing test system providing sourcing and measurement capability for pulsed and continuous LIV test.
•TEC SourceMeter SMUs, 2510 and 2510-AT: Ensure tight temperature control for laser diode modules by controlling its thermo-electric cooler.
•Active temperature control :Prevents temperature variations that could cause the laser diode’s dominant output wavelength to change, leading to signal overlap and crosstalk problems.
•50W TEC Controller :Allows for higher testing speeds and a wider temperature setpoint range than other, lower-power solutions.
•Fully digital P-I-D control :Provides greater temperature stability and can be easily upgraded with a simple firmware change.
•Autotuning capability for the thermal control loop (2510-AT) :Eliminates the need to use trial-and-error experimentation to determine the best combination of P, I, and D coefficients.
•Wide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) :Covers most of the test requirements for production testing of cooled optical components and sub-assemblies.