Optical inspection machine Candela® 7100 series

surfacehard disk drive (HDD)for the electronics industry

The Candela 7100 series delivers advanced defect detection and classification for hard disk drive substrates and media. Built upon the production-proven Candela product line, the 7100 series of HDD defect detection and classification systems helps manufacturers detect and classify critical submicron defects such as micro-pits, bumps, particles and buried defects, for maximizing yield and lowering total cost of inspection. The Candela 7100 series advanced defect detection and classification system is designed specifically for hard disk drive substrates and media. A high-powered dual-wavelength laser is optimized for current defect of interest (DOI) challenges, and multi-channel scatter detectors provide enhanced sensitivity for classification of sub-micron pits, bumps, particles, and buried defects on a full range of substrates. The capability and stability of the 7100 series defect inspector ensures that one platform can be used for multiple process control application points, reducing dependency on tools and methods such as atomic force, scanning electron, and transmission electron microscopes to investigate defects and identify root cause. Detects and classifies HDD sub-micron pits, bumps, particles, buried defects on metal and glass, substrates and media with full disk defect maps Provides faster time to results through full disk maps, with classified defects and actionable data output Reduces dependence on off-line inspection technologies (AFM, SEM, TEM, etc.) resulting in reduced overall cost of ownership Available in either a manual (7110) or fully-automated (7140) configuration