Hardness test indenter NanoFlip

The NanoFlip universal nanomechanical tester has a high precision XYZ motion to position the sample for testing and a flip mechanism to position the sample for imaging. The InView software comes with a suite of test methods that cover a range of test protocols, and also allows users to create their own novel test methods. The InForce 50 actuator performs equally well in both vacuum and ambient conditions. SEM or other microscope images can be recorded by the InView software and synchronized with the mechanical test data. The revolutionary FIB-to-Test technology allows tilting the sample 90°, allowing a seamless transition from FIB to indentation test without having to remove the sample. • Large suite of pre-programmed nanomechanical test methods for improved ease-of-use • InForce 50 actuator for capacitance displacement measurement and electromagnetic force actuation with interchangeable tips • InQuest high-speed controller electronics with 100kHz data acquisition rate and 20µs time constant • XYZ motion system for sample targeting • SEM video capture for synchronized SEM images with test data • Unique software-integrated tip-calibration system for fast, accurate tip calibration • InView control and data review software with Windows ®10 compatibility and method developer for user-designed experiments Applications • Hardness and modulus measurements (Oliver-Pharr) • Continuous stiffness measurement • High speed material property maps • ISO 14577 hardness testing • Nano Dynamic Mechanical Analysis (DMA) • Quantitative scratch and wear testing