The InSEM HT high temperature nanoindentation test system allows independent tip and sample heating in a vacuum environment, and is compatible with many SEM/FIB chambers or standalone vacuum chambers. With temperatures ranging up to 800°C, extreme temperature conditions can be simulated in situ in order to produce consistent, reliable test data. Single-crystal tungsten carbide tips on a molybdenum holder are optimized for use in high temperature test applications, and are available in several geometries.
• InForce 50 actuator with tip heating for capacitance displacement measurement and electromagnetic force actuation with interchangeable tips
• Sample heating up to 800°C with 10mm sample-size and vacuum-compatible sample mounting system
• InQuest high speed controller electronics with 100kHz data acquisition rate and 20µs time constant
• XYZ motion system for sample targeting
• SEM video capture for synchronized SEM images with test data
• Unique software-integrated tip-calibration system for fast, accurate tip calibration
• InView control and data review software with Windows® 10 compatibility and method developer for user-designed experiments
Applications
• High temperature testing
• Hardness and modulus measurements (Oliver-Pharr)
• Continuous stiffness measurement
• High speed material property maps
• Creep measurement
• Strain rate sensitivity
Industries
• Universities, research labs and institutes
• Aerospace
• Automotive manufacturing
• Hard coatings
• Nuclear energy
• Military/defense