- Metrology - Laboratory
- Metrology and Test Equipment
- Optical measuring system
- KoCoS Messtechnik AG
Wafer edge measuring system WATOM Topticalcompactprofilometer
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Characteristics
- Technology
- optical
- Measured material
- wafer edge
- Other characteristics
- compact, profilometer
Description
Single Wafer Edge Profiler WATOM T
Small footprint and consistent accuracy
WATOM T is a compact, inexpensive alternative for applications that have no automation requirements and provides the same quality, process reliability and measurement precision as other WATOM systems.
WATOM T is designed to accept two wafer sizes for quick sample measurement.
Equipped with a touch screen, this tool is easy to use for operators, experts and maintenance staff alike.
Catalogs
Wafer Topography Measurement
16 Pages
Other KoCoS Messtechnik AG products
Wafer edge profile measurement
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.