The Leica XL Stand, modular solution, allows inspection of large samples at high stereoscopic magnifications for applications such as printed circuit boards inspection, forensic toolmark or documentation examination and TFT/LCD inspection.
The XY stage (optional) has a special ESD matt with snap fastener, which when combined with the large base plate, grounds the system to avoid ESD damage to sensitive electronic components. The XY stage (optional) supports large sample sizes up to 400 X 450mm and the stages 300 X 300mm travel distance handles sample sizes up to 12” X 12” so documents up to A4 can be inspected at one time without repositioning.