Orientation measuring system YX-5A
X-ray

Orientation measuring system - YX-5A - Liaodong Radioactive Instrument - X-ray
Orientation measuring system - YX-5A - Liaodong Radioactive Instrument - X-ray
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Characteristics

Measured physical value
orientation
Technology
X-ray

Description

YX-5A high precision sapphire orientation instrument: This is upgraded model product based on YX-2D6A, matches with monochromator and displays by six digits with minimum reading of 1″and ±15″precision. It professionally designed for single crystal silicon, sapphire, gallium arsenide arsenide and other kinds of crystal, mainly used for crystal bar or plate measurement, convenient operation, output displayer and bearing rail on sample table, belongs to common hot model unit. Standard configuration of : GA, GB angular instrument One surface of GA angular instrument can measures ¢2-6inches crystal rounding plate; angle of 111, 100; can measures reference surface of crystal bar110; angle of OF surface. Angle of sapphire A,C,R surface. The other surface of GB product professionally designed for crystal bar, the designation has a 130mm width, 300mm length orientation level plate, 2Nos mobile nylon V shape groove crystal bar holder which can uses for measure surface of ¢2-6 inch diameter, 400mm length crystal bar. For example: angle of silicon (111) sapphire C surface and other crystal; The first one can be used for 2-3inch surface measurement, the second is for 4-6 inch surface.

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X-ray Orientation Instrument

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