Orientation measuring system YX-2D6A
X-ray

orientation measuring system
orientation measuring system
Add to favorites
Compare this product
 

Characteristics

Measured physical value
orientation
Technology
X-ray

Description

YX-2D6A sapphire crystal orientation instrument: is a common type product which designed for multiple crystal l(single crystal silicon, sapphire, gallium etc) based on standard orientation instrument, mainly used for measurement of crystal round plate, crystal bar, its displayer put outside, adds bearing rail on sample table. Standard configuration: GA, GB angular instrument One side of GA angular instrument can measures angle of 2-6inches diameter crystal round plate; 111,100 and so on; it can also measures angle of crystal surface 110, OF, sapphire A.C.R surface and so on. The other surface of GB professionally designed for crystal bar, it matches with level supporting board of 130mm width and 300mm length, matches with 2mobilabe nylon V type crystal bar supporting which can measures 2-6inches crystal plate; At the same time it can measures 2-6inches, 400mm length crystal bar surface; for example silicon(111) sapphire C surface and angle of other crystal. Measures 2-3inches for first one, 4-6inches for second one.

Other Liaodong Radioactive Instrument products

X-ray Orientation Instrument

*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.