Laser measurement system LBIC

3Dcontrol

Laser Beam induced Current’ Voltage (LBIC/LBIV) Measurement System is an important metrology of photovoltaics characterization which can measure the induced current (voltage) distribution. It can analyze different types of defect distribution and uniformity. such as, the induced current (voltage) distribution of solar cell, the quantum efficiency and tesistance distribution of photoelectric element, the research of element absorption and micro-area characteristic of charge generation, and the junction quality of photovoltaic-material and semiconductor. It will help to understand the characteristics of photovoltaic element and the defect distribution which contributes to the improvement of the process. Feature: - 2D/3D induce voitage/current distribution with different image interpolation - Analysis of open circuit voltage (Voc) and short circut current (lec) distribution. For absorber with the same band gap, the LBIV intensity is proportional to local open circuit voltage (Voc). The shunting point / area evaluation also can be analyzed for c-Si, uc-Si, and thin film solar ceIts - Adjustment of laser power, scan step and detention period of scan point - Equip with multiple wavelength laser(405nm, 532nm, 660nm or others) to map the 3D depth induced voktage/current image, and to analyze the characteristic of photoluminescence spectrum (option) - Integrate with temperature control platform for temperature coefficient of band gap (option) - Light induced degradation (LID) investigation (option)