High-speed and high-resolution, while maintaining stable, ultraprecision measuring. Ideal for precision stages, semiconductor inspection/manufacturing systems, and ultraprecision processing machines.
High-resolution scale with signal pitch of approx. 138 nm, outperforming light wave interferometer systems
High stability, unaffected by humidity, air pressure and air disturbances
Reference point accuracy: ±0.1µm
Non-contact design eliminates return error.
Measuring length: 9 types (-R/-RS)
Measuring length: 10 types (-N/-NS)
Special non-magnetic and vacuum-compatible models available
Using low expansion glass: -0.7 x10-6 °C (measuring length: 10 to 420mm)
Resolution: 2.1 pm